Wafer Parallel Test System
471-TT
The new 471-TT is a DC tester with a new concept that realizes simultaneous measurement of plural chips in the wafer process by utilizing measurement technology which we have been accumulating for many years. We have also succeeded to our high-voltage and current measurement technology as one of our advantages. By measuring plural chips simultaneously, we can achieve a significant improvement in productivity compared to conventional testers.
Feature
- Improved cost performance through simultaneous measurement of plural chips(8 /16 parallel)
- By utilizing LAN, data communication time can be significantly shortened.
- Realizing the reduction of measurement time by speeding up relay switching
- Test stability can be achieved, taking advantage of our measurement technology.
| Iteml | Specifications |
|---|---|
| Applicable Devices | Tr, FET, IGBT, Diode etc. |
| Polarity | NPN / PNP, N/P Channel |
| Voltage | 2kV |
| Current | 20A |
| Parallel Test 471-TT/S 471-TT/D |
8 16 (Photo) |
| Test Stations | 1 Station |
| Test Item | 500 |
| Sort Item | 250 |
| Resolution (Bias) | 3 digits |
| Resolution (Measure) | 4 digits |
For details, please refer to the standard specification sheets of each product.
